Fischetti, Massimo V.
Permanent URI for this collectionhttps://hdl.handle.net/10735.1/2310
An expert in how electrons move in solids, Dr. Fischetti is renowned in the field for the development of DAMOCLES, a computer program that was the first to accurately simulate how electrons move in small semiconductors using what is known as the Monte Carlo transport model. The program is used to design transistors for chips in computers, smartphones and advanced video games.
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Browsing Fischetti, Massimo V. by Subject "Electrons"
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Item "Hot Electrons in Si Lose Energy Mostly to Optical Phonons:" Truth or Myth?(American Institute of Physics Inc., 2019-06-05) Fischetti, Massimo V.; Yoder, P. D.; Khatami, Mohammad Mahdi; Gaddemane, Gautam; Van De Put, Maarten L.; 0000-0001-5926-0200 (Fischetti, MV); 0000-0003-0067-8674 (Gaddemane, G); 0000-0001-8014-0350 (Khatami, MM); 0000-0001-9179-6443 (Van de Put, ML); Fischetti, Massimo V.; Khatami, Mohammad Mahdi; Gaddemane, Gautam; Van De Put, Maarten L.Theoretical studies of heat generation and diffusion in Si devices generally assume that hot electrons in Si lose their energy mainly to optical phonons. Here, we briefly review the history of this assumption, and using full-band Monte Carlo simulations - with electron-phonon scattering rates calculated using the rigid-ion approximation and both empirical pseudopotentials and Harris potentials - we show that, instead, electrons lose as much as 2/3 of their energy to acoustic phonons. The scattering rates that we have calculated have been used to study hot-electron effects, such as impact ionization and injection into SiO2, and are in rough agreement with those obtained using density functional theory. Moreover, direct subpicosecond pump-probe experimental results, some of them dating back to 1994, are consistent with the predictions of our model. We conclude that the study of heat generation and dissipation in nanometer-scale Si devices may require a substantial revision of the assumptions that have been considered "common wisdom" so far. © 2019 Author(s).Item Intrinsic Broadening of the Mobility Spectrum of Bulk N-Type GaAsJolley, G.; Umana-Membreno, G. A.; Akhavan, N. D.; Antoszewski, J.; Faraone, L.; Fischetti, Massimo V.Modern devices consisting of multiple semiconductor layers often result in the population of numerous distinct carrier species. Conventional Hall measurements at a single-magnetic-field strength provide only a weighted average of the electron mobility and carrier concentration of a semiconductor structure and, therefore, are of limited use for the extraction of carrier transport information. In recent years, mobility spectrum analysis techniques, which have been developed to extract a mobility spectrum from magnetic field-dependent conductivity-tensor measurements, have been applied in the analysis of carrier conductivity mechanisms of numerous semiconductor structures and devices. Currently there is a severe lack of reported studies on theoretical calculations of the mobility distribution of semiconductor structures or devices. In addition, the majority of reports on experimental mobility spectrum analysis are of complex, multi layered structures such as type-II superlattices, and the interpretation of the mobility spectra has been difficult. Therefore, a good understanding of the mobility spectrum has yet to be developed. For example, it is often assumed that distinct peaks of a mobility spectrum result from fundamentally different conduction mechanisms such as the bulk and surface conduction of narrow-bandgap semiconductors. In this article, we present calculations of the electron mobility distribution of bulk GaAs, which predict the existence of multiple mobility spectrum peaks that result from electron conductivity in the Γ conduction band. This report serves as an important and simple test case upon which experimentally measured mobility spectra can be compared. It also presents insight into the general nature of electron mobility distributions.Item Modeling of Electron Transport in Nanoribbon Devices Using Bloch Waves(Institute of Electrical and Electronics Engineers Inc.) Laturia, Akash A.; Van De Put, Maarten L.; Fischetti, Massimo V.; Vandenberghe, William G.; 0000-0001-5926-0200 (Fischetti, MV); 21146635654041982414 (Vandenberghe, WG); Laturia, Akash A.; Van De Put, Maarten L.; Fischetti, Massimo V.; Vandenberghe, William G.One-dimensional (1D) materials present the ultimate limit of extremely scaled devices by virtue of their spatial dimensions and the excellent electrostatic gate control in the transistors based on these materials. Among 1D materials, graphene nanoribbon (a-GNR) prove to be very promising due to high carrier mobility and the prospect of reproducible fabrication process [1]. Two popular approaches to study atomistically the electronic properties expand the wavefunction on either a plane-wave basis set, or through the linear combination of localized atomic orbitals. The use of localized orbitals, especially in the tight-binding (TB) approximation, enables highly scalable numerical implementations. Through continuous improvements in methods and computational capabilities, atomistically describing electronic transport in devices containing more than thousands of atoms has become feasible. Plane waves, while not as scalable, are very popular as the basis of accurate ab-initio software [2]. However, for modeling of transport through larger devices, the computational burden prohibits the direct use of a plane wave basis [3]. Here, we demonstrate a study of the transport characteristics of nanoribbon-based devices using a hybrid approach that combines the benefits of plane waves while retaining the efficiency provided by the TB approximation. © 2018 IEEE.