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    • Wafer-Level Adaptive Vₘᵢₙ Calibration Seed Forecasting 

      Xanthopoulos, Constantinos; Neethirajan, Deepika; Boddikurapati, S.; Nahar, A.; Makris, Yiorgos (Institute of Electrical and Electronics Engineers Inc., 2019-03-25)
      To combat the effects of process variation in modern, high-performance integrated Circuits (ICs), various post-manufacturing calibrations are typically performed. These calibrations aim to bring each device within its ...