Design and Implementation of an Optical Characterization System for Semiconductor Material Characterization
Date
2018-12
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Abstract
This thesis describes the methods and strategies to implement and validate an optical characterization data acquisition system and its application to semiconductor material characterization. Use and modes of operation of this system is covered and its validation through the use of commercial Silicone (Si) base PIN junctions demonstrated. Finally, the system is used to characterize Cadmium-Telluride/Cadmium-Sulfide (CdTe/CdS) solar cells and thin film Methylammonium Lead Bromide (MAPbBr3) Perovskites.
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Keywords
Optical, Semiconductors—Characterization, Thin films—Characterization, Perovskite, Solar cells—Characterization, Optoelectronic devices