Dian Zhou joined the UT Dallas faculty in 1999 as a full professor in the Department of Electrical Engineering. His research interests include:
- High Speed and Low Power VLSI Circuits
- Analog IC Performance Optimization
- Silicon Biosensors
- CAD Tools and Algorithms
- Biomedical Electronics
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Drop test is usually adopted in the integrated circuit (IC) testing to estimate the shock resistance capability of IC packaging. Generally, it is very time consuming for the drop test simulation, therefore, the fast numerical ...
With increasing dimension of variation space and computational intensive circuit simulation, accurate and fast yield estimation of realistic SRAM chip remains a significant and complicated challenge. In this paper, du ...
In this paper, we develop a general pessimism reduction framework for design optimization of timing closure. Although the modified graph based timing analysis (mGBA) slack model can be readily formulated into a quadratic ...