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dc.contributor.authorGao, Ruizhi
dc.contributor.authorWong, W. Eric
dc.date.accessioned2019-08-14T19:43:44Z
dc.date.available2019-08-14T19:43:44Z
dc.date.created2018-05-27
dc.identifier.issn9781450356381
dc.identifier.urihttps://hdl.handle.net/10735.1/6780
dc.descriptionFull text access from Treasures at UT Dallas is restricted to current UTD affiliates (use the provided Link to Article).
dc.description.abstractIn practice, a program may contain multiple bugs. The simultaneous presence of these bugs may deteriorate the effectiveness of existing fault-localization techniques to locate program bugs. While it is acceptable to use all failed and successful tests to identify suspicious code for programs with exactly one bug, it is not appropriate to use the same approach for programs with multiple bugs because the due-to relationship between failed tests and underlying bugs cannot be easily identified. One solution is to generate fault-focused clusters by grouping failed tests caused by the same bug into the same clusters. We propose MSeer - an advanced fault localization technique for locating multiple bugs in parallel. Our major contributions include the use of (1) a revised Kendall tau distance to measure the distance between two failed tests, (2) an innovative approach to simultaneously estimate the number of clusters and assign initial medoids to these clusters, and (3) an improved K-medoids clustering algorithm to better identify the due-to relationship between failed tests and their corresponding bugs. Case studies on 840 multiple-bug versions of seven programs suggest that MSeer performs better in terms of effectiveness and efficiency than two other techniques for locating multiple bugs in parallel.
dc.language.isoen
dc.publisherACM
dc.relation.isPartOfProceedings - International Conference on Software Engineering, 40th
dc.relation.urihttp://dx.doi.org/10.1145/3180155.3182552
dc.rights©2018 The Authors
dc.subjectDistance geometry
dc.subjectSoftware failures
dc.subjectDebugging in computer science
dc.subjectSoftware engineering
dc.titleMSeer: An Advanced Technique for Locating Multiple Bugs in Parallel
dc.type.genrearticle
dc.description.departmentErik Jonsson School of Engineering and Computer Science
dc.identifier.bibliographicCitationGao, R., and W. E. Wong. 2018. "MSeer: An advanced technique for locating multiple bugs in parallel." Proceedings - International Conference on Software Engineering, 40th,137142: 1064, doi:10.1145/3180155.3182552
dc.identifier.volume137142
dc.contributor.utdAuthorGao, Ruizhi
dc.contributor.utdAuthorWong, W. Eric
dc.contributor.VIAF65810187 (Wong, WE)


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