Using Photoelectron Spectroscopy in the Integration of 2D Materials for Advanced Devices

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dc.contributor.ORCID0000-0001-5566-4806 (Wallace, RM)
dc.contributor.authorAddou, Rafik
dc.contributor.authorWallace, Robert M.
dc.contributor.utdAuthorAddou, Rafik
dc.contributor.utdAuthorWallace, Robert M.
dc.date.accessioned2020-09-15T16:19:09Z
dc.date.available2020-09-15T16:19:09Z
dc.date.issued2019-01-31
dc.descriptionDue to copyright restrictions and/or publisher's policy full text access from Treasures at UT Dallas is limited to current UTD affiliates (use the provided Link to Article).
dc.description.abstractThe first commercial applications of two dimensional (2D) layered materials such as graphite and MoS₂ used their lubricant properties. Following the discovery of graphene and its potential applications in various fields, increased interest has focused on other 2D materials such as transition metal dichalcogenides (TMDs) offering tremendous opportunities in advanced optoelectronics and ultra-thin electronics. Using X-ray photoelectron spectroscopy (XPS), this review addresses the facets of the device fabrication and integration and correlates at the nanometer scale the device behavior to the TMD properties. Understanding and solving the integration challenges will make the TMD technology jump from the current phase of experimental proof of concept and laboratory research to a relevant prototype demonstration and production phase.
dc.description.departmentErik Jonsson School of Engineering and Computer Science
dc.description.sponsorshipNational Science Foundation (NSF) award no. 1407765
dc.identifier.bibliographicCitationAddou, Rafik, and Robert M. Wallace. 2019. "Using photoelectron spectroscopy in the integration of 2D materials for advanced devices." Journal of Electron Spectroscopy and Related Phenomena 231: 94-103, doi: 10.1016/j.elspec.2018.01.006
dc.identifier.issn0368-2048
dc.identifier.urihttps://dx.doi.org/10.1016/j.elspec.2018.01.006
dc.identifier.urihttps://hdl.handle.net/10735.1/8889
dc.identifier.volume231
dc.language.isoen
dc.publisherElsevier Science B.V.
dc.rights©2018 Elsevier B.V. All rights reserved.
dc.source.journalJournal of Electron Spectroscopy and Related Phenomena
dc.subjectX-ray photoelectron spectroscopy
dc.subjectTwo-dimensional materials
dc.subjectAtomic layer deposition
dc.subjectMaterials
dc.subjectMolybdenum(IV) Sulfide
dc.subjectThin-films
dc.subjectDielectrics
dc.subjectOxidation
dc.subjectGraphene
dc.subjectSpectroscopy
dc.titleUsing Photoelectron Spectroscopy in the Integration of 2D Materials for Advanced Devices
dc.type.genrearticle

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