Oxidation of GaSb(100) and its Control Studied by Scanning Tunneling Microscopy and Spectroscopy

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Abstract

Atomic-scale knowledge and control of oxidation of GaSb(100), which is a potential interface for energy-efficient transistors, are still incomplete, largely due to an amorphous structure of GaSb(100) oxides. We elucidate these issues with scanning-tunneling microscopy and spectroscopy. The unveiled oxidation-induced building blocks cause defect states above Fermi level around the conduction-band edge. By interconnecting the results to previous photoemission findings, we suggest that the oxidation starts with substituting second-layer Sb sites by oxygen. Adding small amount of indium on GaSb(100), resulting in a (4 x 2)-In reconstruction, before oxidation produces a previously unreported, crystalline oxidized layer of (1 x 3)-O free of gap states.

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Keywords

Gallium(III) Antimonide, Gallium alloys, Oxidation, Semiconductors, Scanning tunneling microscopy, Low energy electron diffraction

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Rights

©2015 AIP Publishing LLC.

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